High Magnification SEM SEM Images: With the addition of our second SEM, MicroVision Laboratories’ ability to capture extremely high resolution and magnification images has improved several fold. One of the main attractions of the surface scanning images obtained in an SEM is the breadth of detail and information that they can convey. Because of the fact that the surface of the sample is rastered by the scanning beam, all of the minute details of a surface can be easily revealed. The other advantage of this technique is the inherent depth and three-dimensionality in the images it produces. These features combine to make a well taken SEM image one of the most breath-taking and immediately impressive images that one can produce, of objects ranging from 10 mm to 10 nm in size. Example of a High Resolution SEM Image Feature in Lower Right Corner of the Image to the Left This image depicts the amount detail that is still present after zooming into a high-resolution SEM image we have taken. High Magnifications: Proper imaging in an SEM can depend on a number of different factors, many of which are related to the magnifications and types of materials one wishes to image. Our new instrument allows us to overcome many of the barriers associated with complex features and difficult material through the excellent control available over the electron beam. Samples that tend to charge, cannot be coated, or have fine structures that can cause beam distortions can all be imaged reliably with extremely low beam currents in our SEM, as low as 5 pA. Similarly, semi-conductors, thin coatings, or fragile samples such as polymers can also be imaged using low excitation energies, often as low as 1 kV. The ability of our trained operators to digitally control minute variations in the beam conditions allows for extremely high quality images to be obtained on a wide variety of samples. We regularly produce images of samples between 250,000x and 500,000x, and have imaged at more than 750,000x on this instrument in the past. This kind of magnification and resolution with a standard source SEM is exceptional. We’re confident we can compete favorably with many FE or TEM instruments for magnification and clarity of image. Example of High Magnification Imaging, 350kX Features are still clearly discernible Example of High Magnification Imaging, 950kX 15 to 40nm gold grains on silicon Digital Image Integration: In addition to the quality of the images obtained on our new equipment, the integration of a high resolution digital imaging system means that every picture taken can yield not only a direct visual impact, but can be analyzed, manipulated, and expanded to provide in-depth data beyond visual appearance. Using extremely high resolution images allows for a very wide field of view to be imaged in one photo, while still allowing for the details of fine structures to be examined, as needed, later on. Using high resolution images, a wider range of features can be examined, while maintaining detail on the individual features. Our system also has the capacity to integrate directly with a digital particle analysis system, in order to facilitate particle sizing, critical point measurements, and phase density analyses. All of these features combine to make our capacity to deliver high quality images invaluable for any investigation where size, structure and morphology matter.

home | about us |  services | gallery |  links | directions |  contact us

MicroVision Labs, Inc.  187 Billerica Road, Chelmsford, MA 01824   Phone: 978-250-9909   Fax: 978-250-9901   Toll Free: 877-250-9909 Copyright © 2008 MicroVision Labs, Inc.. All rights reserved. Website design by