Advanced Elemental Mapping Applications
EDS Application Flyer (pdf - right click to download)
Elemental Mapping Application Flyer (pdf - right click to download)
Principle of Operation:
The ability of the SEM to gather atomic chemical data through EDX spectroscopy is one of the most important features that make SEM analysis indispensible for a variety of analytical applications. During imaging, the SEM sweeps a focused beam of accelerated electrons across the surface of the sample. These electrons are imaged, as they either displace electrons in the material, or are reflected out of the material by nuclear interaction. While it is still these electrons that are of interest for imaging applications, the energy that the electron beam ‘donates’ to the sample material in this impact is of especial interest. The energy from this electron beam causes a host of electron transitions, where the electrons in the material are excited and then, eventually, collapse back down into their rest energy states. When the electrons relax, the excess energy |  |
they shed is emitted from the sample in the form of X-rays. Because the precise structure of every element is different, the exact energies and patterns of these X-rays is specific to each individual element. An EDX system analyzes these X-rays and determines the atomic composition of whatever material the SEM is imaging.
 | The Application:
The chemical information from an X-ray spectrum is extremely valuable, and it becomes immeasurably more useful when it can be precisely correlated with individual particles, phases, or contaminants. This is precisely what the SEM can accomplish. Because the X-rays are only generated when the electron beam is focused on a surface, only these surfaces are generating X-rays. So spectra can be generated of individual areas or particles. When combined with a digital system, this means that, not only can individual particles be examined as needed, but that this spectral information can be generated for an entire field of view. This indexed data can be saved, and called back up later.
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Our Advantage:
Generally, the barrier to this type of analysis is the amount of time it would take to complete a usable amount of data. With the high count rate and excellent signal to noise ratio of our QDD EDX detector, excellent data sets can be collected and analyzed in minutes, rather than hours. By examining this data, areas containing any number of elements can be highlighted with color, phases with consistent composition characteristics can be identified, and variations in coatings or materials detailed. This elemental mapping technique allows for any client to create an immediately compelling presentation of the chemical landscape in a sample. With complete, indexed chemical data any quantification, comparison, or reproduction of analysis from an area as small as a single pixel can be done at any later date. This extremely complete data analysis tool offers the potential for repeated in-depth investigations of any sample’s data, with practically no increase in time, complexity or cost. | |
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