Light Microscopy/Polarized Light Microscopy (PLM)
Light microscopy allows for the examination of optical and structural properties of a variety of samples. Optical properties such as polarization and birefringence help to differentiate between fibers, minerals, ceramics, biological materials and opaque materials including paints, coatings and metallic particles. This allows a wide range of particles to be quickly and effectively identified and quantified by an experienced analyst.
Nomarski/Differential Interference Contrast (DIC) Imaging
Translucent or transparent coatings on metallic or semi-conductor substrates are very difficult to image due to their reflective nature. Nomarski/DIC imaging is an effective method for accentuating differences in thickness, density or the optical index in these cases. This analysis enhances and highlights subtle features with brilliant color gradients and captures them with a high resolution digital imaging system. Let us bring out your sample’s hidden features.
Particle Size Analysis (PSA)
The diameter, perimeter, shape and aggregation patterning of particles are often of interest with manufactured or naturally occurring materials. Our PSA method is useful to measure and document the morphology and distribution of a sample. Whether you have particles, pores or film coatings, we can accommodate your project needs.
Scanning Electron Microscopy (SEM)
SEM allows for high magnification surface examinations of a wide variety of samples. Providing brilliant resolution as well as incredible depth of field, the SEM, especially when combined with EDS, is often considered the most powerful analytical tool of our time. Let us show you why.
X-Ray Imaging (Industrial)
X-ray imaging allows us to look inside of a device without opening it up. This real-time nondestructive inspection technique can be used on packaged electronic devices to one of a kind ancient artifacts. With rapid image acquisition and high sample throughput, X-ray imaging is particularly useful for sample screening and quality control issues. It is also often the first step in failure analysis and polished cross section projects.